Computer chips coming off an assembly line are tested for quality and are rated defective (d) or good (g). A quality control inspection carried out every hour tests the chips until a run of two consecutive chips are defective or until four chips have been tested, whichever occurs first. The sample space S for this experiment is S = {dd, gdd, dgdd, dgdg, dggd, dggg, gdgd, gdgg, ggdd, ggdg, gggd, } The probability that a chip is defective is 0.02. We define a random variable Y as the number of defectives found in the quality control inspection. The expected value of the random variable Y is, approximately, a. 0.0799468
b. 2
c. 1.542013
d. 1
e. O