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The fraction of defective integrated circuits produced in a photolithography process is being studied. a random sample of 300 circuits is tested, revealing 17 defectives. (a) calculate a 95% two-sided confidence interval on the fraction of defective circuits produced by this particular tool. round the answers to 4 decimal places. less-than-or-equal-to p less-than-or-equal-to (b) calculate a 95% upper confidence bound on the fraction of defective circuits. round the answer to 4 decimal places. p less-than-or-equal-to

Circle a has a diameter of 7 inches, a circumference of 21.98 inches, and an area of 38.465 square inches. the diameter of circle b is 6 inches, the circumference is 18.84 inches, and the area is 28.26 square inches. part a: using the formula for circumference, solve for the value of pi for each circle. (4 points) part b: use the formula for area and solve for the value of pi for each circle. (4 points)