Data on the oxide thickness of semiconductor wafers are as follows: 425, 431, 416, 419, 421, 436, 418, 410, 431, 433, 423, 426, 410, 435, 436, 428, 411, 426, 409, 437, 422, 428, 413, 416.calculate a point estimate of the mean oxide thickness for all wafers in the population.

423

Step-by-step explanation:

The sample mean is a point estimate of the population mean.

Therefore a point estimate of the mean oxide thickness for all wafers in the population is the mean of the sample data on the oxide thickness of semiconductor wafers.

To calculate the sample mean, we sum all the sample data and divide by the sample size which is 24.  We get 423.33 ≈423

answer:

sometimes

*i think

true

explanation: