Assume a 15 cm diameter wafer has a cost of 12, contains 84 dies, and has 0.020 defects/cm2
assume a 20 cm diameter wafer has a cost of 15, contains 100 dies, and has 0.031 defects/cm2
a. find the yield for both wafers.
b. find the cost per good die for both wafers.
c. if the number of dies per wafer is increased by 10% and the defects per area unit increases by 15% find the die area and yield.
d. assume a fabrication process improves the yield from 0.92 to 0.95. find the defects per area
unit for each version of the technology given a die area of 200 mm2